Surface Characterization Equipment

1- Multimodal Atomic Force Microscope

Model: PARK SYSTEMS XE7

Remark: surface characterization and measurements system for nanostructure dimensions and manipulations at the nanoscale:

Features: True Non-Contact AFM mode, Basic Contact AFM model, Lateral Force Microscopy (LFM) Phase Imaging, and Force Modulation Microscopy (FMM) mode.