Surface Characterization and Imaging Equipment

Systems:

  • µ-Raman Spectroscopy and Microscopy

Model: RENISHAW inVia

Remark: Advanced Raman spectroscopy system for nanoscale samples using reflection mode. System has

a- 3 laser lines: 532nm. 633nm. and 1064nm.

b- 2 detectors: silicon detector(300nm-1100nm) and InGaAs detector (1000nm-1600nm).

Features: advanced Raman and photoluminescence mapping techniques.



  • Solar Cell Testing Station


Model: Solar Simulator (PET), source meter (KEITHLEY 2636B)

Remark: AAA Solar simulator with 1.5G, coupled with 2-micromanipulators connected to a source meter.

  • Photodetector characterization setup


Remark: customizable photocurrent spectra and photodetector setup for UV-VIS-NIR detection. The setup utilizes confocal measurements of photocurrent measurements.

Tools:

  • SWIR, MWIR, and LWIR Thermal Cameras:


Model: MWIR Camera (XENICS ONCA-1801), LWIR Camera (XENICS ONCA-1802), SWIR Camera (XENICS MCT-1709)

  • Thermal Imaging Camera


Model: FLIR ETS320

  • High Power laser Temperature Controller


Model: ILX LIGHTWAVE LDT-5980

  • High Power laser Temperature Controller


Model: ILX LIGHTWAVE LDT-5980

  • Laser Diode Controller


Model: ILX LIGHTWAVE LDC-3724B

Photodiode Amplifier


Model: ILX LIGHTWAVE PDA-6424

635nm Fiber Coupled Laser Source


Model: THORLABS S1FC635

1550nm Fiber Coupled Laser Source


Model: THORLABS S1FC1550

  • Optical Power Meter


Model: NEWPORT 1830-R

Optical Power Meter


Model: ILX LIGHTWAVE OMM-6810B