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Systems:
Systems:
µ-Raman Spectroscopy and Microscopy
Model: RENISHAW inVia
Remark: Advanced Raman spectroscopy system for nanoscale samples using reflection mode. System has
a- 3 laser lines: 532nm. 633nm. and 1064nm.
b- 2 detectors: silicon detector(300nm-1100nm) and InGaAs detector (1000nm-1600nm).
Features: advanced Raman and photoluminescence mapping techniques.
Solar Cell Testing Station
Model: Solar Simulator (PET), source meter (KEITHLEY 2636B)
Remark: AAA Solar simulator with 1.5G, coupled with 2-micromanipulators connected to a source meter.
Photodetector characterization setup
Remark: customizable photocurrent spectra and photodetector setup for UV-VIS-NIR detection. The setup utilizes confocal measurements of photocurrent measurements.
Tools:
Tools:
SWIR, MWIR, and LWIR Thermal Cameras:
Model: MWIR Camera (XENICS ONCA-1801), LWIR Camera (XENICS ONCA-1802), SWIR Camera (XENICS MCT-1709)
Thermal Imaging Camera
Model: FLIR ETS320
High Power laser Temperature Controller
Model: ILX LIGHTWAVE LDT-5980
High Power laser Temperature Controller
Model: ILX LIGHTWAVE LDT-5980
Laser Diode Controller
Model: ILX LIGHTWAVE LDC-3724B
Photodiode Amplifier
Model: ILX LIGHTWAVE PDA-6424
635nm Fiber Coupled Laser Source
Model: THORLABS S1FC635
1550nm Fiber Coupled Laser Source
Model: THORLABS S1FC1550
Optical Power Meter
Model: NEWPORT 1830-R
Optical Power Meter
Model: ILX LIGHTWAVE OMM-6810B
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